APE
| card | |
| staff | |
| research | |
| instrumentation | |
| more details | |
| publications | |
| related links | |
.:: home |
|
| ::. phonebook | |
| ::. site map | |
APE - Advanced Photoemission Experiment
instrumentation
Summary |
APE-LE |
APE-HE |
| Experiment | High-resolution photoemission;
Fermi sruface and Fermi surface instabilities mapping |
Photoelectron spectro(micro)scopy; Electronic spin investigation; Magnetic microscopy |
| Undulator | Apple II quasi-periodic Period 125 mm |
Apple II periodic Period 60 mm |
| Monochromator | Plane grating |
Plane grating |
| Energy range | 10-100 eV |
140-1500 eV |
| Photon resolution E/DE | ~1.3X104 @ ~60 eV ~1.7X104 @ ~45 eV |
~104 @ ~400 eV
~3-5*103 @ ~900 eV |
| Experimental resolution | 6-8 meV |
- |
| Polarization | Variable (linear -- horizontal and vertical, circular) | Variable (linear -- horizontal and vertical, circular) |
| Higher order light contribution | < 1% |
- |
| Spot size | 50 X 100 µm | 80-200 nm (with Fresnel zone-plate) or 25 X 100 µm (with toroidal refocusing mirror) |
| End station equipment | Scienta SES-2002 analyzer; Cryostat T<17 K; Automatized manipulator for complete Fermi surface mapping; LEED; Sputter gun; Evaporators |
Zone-plate focusing optics;
Omicron 125 mm hemispherical analyzer; 70 KV Mott detector(s) |
| Preparation chambers |
Standard preparation techniques (ion-sputtering,
annealing, cleaving, e-beam evaporation);
LEED and Auger characterization; Kerr-effect measurements; Atomic resolution STM (room temperature) |
|
.:. top