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Personal Data
Italian Citizen
Born in Trieste 16 August 1973
Academic
14 December 1999 Degree in Physics : “Cross Section Scanning
Tunnelling Microscopy of Delta layers of Si and Be in GaAs”.
Past academic experiences
- 2000 alternative to military service
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2001 Mechanical Technician at Macuz S.r.l. Company; SoftwareProgrammer at Euris S.r.l. and at Telital S.p.a.
- From 2002 Tem Technician in the National Laboratory Tasc-INFM
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2003 January, School of Transmission Electron Microscopy inAntwerp (Responsible D. Van Dyck)
Main skills and point of interest
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Scanning Tunnelling Microscopy and Spectroscopy in Cross Sectionof semiconductors
- Ultra High Vacuum Technology
- Samples preparation for TEM
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Transmission Electron Microscopy of semiconductors, nanotubesand polymers.
Known Languages
Italian, English,
scholastic knowledge of German.
Some recent pubblications
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D. Furlanetto, D. Orani, S. Rubini, S. Modesti, E. Carlinoand A Franciosi
HIGH SPATIAL RESOLUTION STUDIES OF MICROSCOPIC CAPACITORS IN GaAs
Proceedings 5th Multinational Congress on Electron Microscopy.Rinton Press, Inc. 2001
- S. Modesti, D. Furlanetto, M. Piccin, S. Rubini, A. Franciosi
"High-resolution potential mapping in semiconductor nanostructuresby cross-sectional scanning tunneling microscopy and spettroscopy"
Applied Physics Letters 82, 1932 (2003)
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E. Carlino, S. Modesti, D. Furlanetto, M. Piccin, S. Rubiniand A. Franciosi
ATOMIC RESOLUTION COMPOSITION ANALYSIS BY SCANNING TRANSMISSIONELECTRON MICROSCOPY HIGH-ANGLE ANNULAR DARK-FIELD IMAGING
(Appl. Phys. Lett. Scheduled for publication on July 2003)
- E. Carlino D. Furlanetto, A. Colli and A Franciosi
HIGH SPATIAL RESOLUTION TEM STUDIES OF GaAs/ZnSe INTERFACES GROWNBY DIFFERENT MBE PROCEDURES
(to be published on Inst. Phys. Conf. Ser. Proc. XIII MSM Cambridge2003)
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